COTS EEE are intended to be used on long term mission in space application (~15Y). Some parts, as integrated circuits, are AEC-Q qualified and wear out tests are requested in that frame acc. to AEC-Q100 §4.3 which demonstrates ~15 years as a minimum, life time only. The goal of this study is to estimate wear out for EEE COTS integrated circuits but also for discrete and passive components in the way to be compatible with space system life time specified beyond 15 years. 6 Representative families / technologies for COTS EEE are: - Integrated circuits (mainly DSM) memory + linear , discrete components and passive resistors and tantalum and ceramic capacitors. The 6 candidates by family are: DDR2 memory IS46DR16640B-25DBLA2 from ISSI, linear integrated circuit LT3845 TSSOP16 from NSC, MOSFET from Nexperia (choice on going), Ceramic capacitor C0402 T2 100nF from KEMET , Tantalum capacitor D226K035C0300 in TH3-D from Vishay Sprague , resistor RN73H2BTTD47R5B25 from KOA . Proposal is to perform dedicated long term “life test” at maximum rated temperature up to wear out during 6500H.
